"Heavy-ion irradiation study in SOI-based and bulk-based junctionless ..."

N. Vinodhkumar et al. (2015)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.09.011

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/VinodhkumarBNS15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/VinodhkumarBNS15
N. Vinodhkumar, Y. V. Bhuvaneshwari, K. K. Nagarajan, R. Srinivasan:
Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation. Microelectron. Reliab. 55(12): 2647-2653 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.