"Post-breakdown characterization in thin gate oxides."

E. Viganò et al. (2002)

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DOI: 10.1016/S0026-2714(02)00176-2

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type: Journal Article

metadata version: 2023-07-18

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E. Viganò, A. Ghetti, Gabriella Ghidini, Alessandro S. Spinelli:
Post-breakdown characterization in thin gate oxides. Microelectron. Reliab. 42(9-11): 1491-1496 (2002)

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