"Reliability assessment platform for the power semiconductor devices - ..."

Ionut Vernica, Ke Ma, Frede Blaabjerg (2017)

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DOI: 10.1016/J.MICROREL.2017.06.052

access: closed

type: Journal Article

metadata version: 2025-03-03

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Ionut Vernica, Ke Ma, Frede Blaabjerg:
Reliability assessment platform for the power semiconductor devices - Study case on 3-phase grid-connected inverter application. Microelectron. Reliab. 76-77: 31-37 (2017)

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