"Correlation between infrared transmission spectra and the interface trap ..."

V. Em. Vamvakas et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.072

access: closed

type: Journal Article

metadata version: 2020-10-26

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V. Em. Vamvakas, M. Theodoropoulou, Stavroula N. Georga, Christoforos A. Krontiras, M. N. Pisanias:
Correlation between infrared transmission spectra and the interface trap density of SiO₂ films. Microelectron. Reliab. 47(4-5): 834-837 (2007)

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