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"Charge accumulation in the dielectric of the nanocluster NVM MOS ..."

V. I. Turchanikov et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.075

access: closed

type: Journal Article

metadata version: 2020-02-22

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V. I. Turchanikov, A. N. Nazarov, V. S. Lysenko, V. Ostahov, O. Winkler, B. Spangenberg, H. Kurz:
Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation. Microelectron. Reliab. 47(4-5): 626-630 (2007)

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