"Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS ..."

James C. Tsang, Massimo V. Fischetti (2001)

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DOI: 10.1016/S0026-2714(01)00194-9

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type: Journal Article

metadata version: 2023-09-08

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James C. Tsang, Massimo V. Fischetti:
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies. Microelectron. Reliab. 41(9-10): 1465-1470 (2001)

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