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"Admittance spectroscopy of traps at the interfaces of (100)Si with ..."

L. Truong et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.11.039

access: closed

type: Journal Article

metadata version: 2020-02-22

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L. Truong, Y. G. Fedorenko, V. V. Afanasev, A. Stesmans:
Admittance spectroscopy of traps at the interfaces of (100)Si with Al₂O₃, ZrO₂, and HfO₂. Microelectron. Reliab. 45(5-6): 823-826 (2005)

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