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"Degradation in polysilicon thin film transistors related to the quality of ..."
Hamid Toutah et al. (2003)
- Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre
, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectron. Reliab. 43(9-11): 1531-1535 (2003)
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
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