"Physically-based extraction methodology for accurate MOSFET degradation ..."

Giulio Torrente et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.063

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type: Journal Article

metadata version: 2024-10-06

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Giulio Torrente, Jean Coignus, Sophie Renard, Alexandre Vernhet, Gilles Reimbold, David Roy, Gérard Ghibaudo:
Physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectron. Reliab. 55(9-10): 1417-1421 (2015)

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