"High temperature long term stability of SiC Schottky diodes."

Antonio Testa et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.026

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type: Journal Article

metadata version: 2020-03-24

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Antonio Testa, Salvatore De Caro, Sebastiano Russo, D. Patti, Lucia Torrisi:
High temperature long term stability of SiC Schottky diodes. Microelectron. Reliab. 51(9-11): 1778-1782 (2011)

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