"Applying the fWLR concept to Stress induced leakage current in ..."

Guoqiao Tao et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.04.012

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type: Journal Article

metadata version: 2020-02-22

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Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper:
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectron. Reliab. 44(8): 1269-1273 (2004)

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