"Electrical measurements of voltage stressed ..."

Z. Tang et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.02.012

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type: Journal Article

metadata version: 2020-02-22

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Z. Tang, P. D. Ye, D. Lee, Chu-Ryang Wie:
Electrical measurements of voltage stressed Al₂O₃/GaAs MOSFET. Microelectron. Reliab. 47(12): 2082-2087 (2007)

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