"Development of highly accelerated electromigration test."

Cher Ming Tan et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.034

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type: Journal Article

metadata version: 2020-02-22

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Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low:
Development of highly accelerated electromigration test. Microelectron. Reliab. 46(9-11): 1638-1642 (2006)

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