"Mechanism of nitrogen-enhanced negative bias temperature instability in ..."

Shyue Seng Tan et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.02.015

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type: Journal Article

metadata version: 2020-10-30

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Shyue Seng Tan, Tupei Chen, Chew Hoe Ang, Lap Chan:
Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET. Microelectron. Reliab. 45(1): 19-30 (2005)

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