"Numerical study of destruction phenomena for punch-through IGBTs under ..."

Tomohiro Tamaki et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.045

access: closed

type: Journal Article

metadata version: 2020-02-22

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Tomohiro Tamaki, Yoshinori Yabuuchi, Masato Izumi, Norio Yasuhara, Kazutoshi Nakamura:
Numerical study of destruction phenomena for punch-through IGBTs under unclamped inductive switching. Microelectron. Reliab. 64: 469-473 (2016)

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