"Investigation of the hot carrier degradation in power LDMOS transistors ..."

Andrea Natale Tallarico et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.043

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type: Journal Article

metadata version: 2021-05-07

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Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna:
Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. Microelectron. Reliab. 76-77: 475-479 (2017)

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