"Analysis of aging effects - From transistor to system level."

Maike Taddiken et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.10.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Analysis of aging effects - From transistor to system level. Microelectron. Reliab. 67: 64-73 (2016)

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