"Advanced analysis on board trace reliability of WLCSP under drop impact."

Ahmer Syed et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.02.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ahmer Syed, Tong Yan Tee, Hun Shen Ng, Rex Anderson, Choong Peng Khoo, Boyd Rogers:
Advanced analysis on board trace reliability of WLCSP under drop impact. Microelectron. Reliab. 50(7): 928-936 (2010)

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