"Experimental study of bias dependence of pulsed laser-induced single-event ..."

Yabin Sun et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.08.008

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type: Journal Article

metadata version: 2024-07-25

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Yabin Sun, Jun Fu, Yudong Wang, Wei Zhou, Zhihong Liu, Xiaojin Li, Yanling Shi:
Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT. Microelectron. Reliab. 65: 41-46 (2016)

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