"Could electronics reliability be predicted, quantified and assured?"

Ephraim Suhir (2013)

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DOI: 10.1016/J.MICROREL.2013.03.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ephraim Suhir:
Could electronics reliability be predicted, quantified and assured? Microelectron. Reliab. 53(7): 925-936 (2013)

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