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"Detailed study and projection of hard breakdown evolution in ultra-thin ..."
John S. Suehle et al. (2005)
- John S. Suehle, Baozhong Zhu, Yuan Chen, Joseph B. Bernstein:
Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectron. Reliab. 45(3-4): 419-426 (2005)
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