"Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. ..."

Mile K. Stojcev (2004)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2003.12.010

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/Stojcev04c
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/Stojcev04c
Mile K. Stojcev:
Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X. Microelectron. Reliab. 44(3): 547-548 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.