"Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer ..."

Mile K. Stojcev (2003)

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DOI: 10.1016/S0026-2714(03)00158-6

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type: Journal Article

metadata version: 2020-02-22

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Mile K. Stojcev:
Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7. Microelectron. Reliab. 43(7): 1171-1172 (2003)

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