"Mechanisms of positive gate bias stress induced instabilities in power ..."

Ninoslav Stojadinovic et al. (2001)

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DOI: 10.1016/S0026-2714(01)00143-3

access: closed

type: Journal Article

metadata version: 2023-09-30

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Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev:
Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs. Microelectron. Reliab. 41(9-10): 1373-1378 (2001)

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