"NBTI and irradiation related degradation mechanisms in power VDMOS ..."

Ninoslav Stojadinovic et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.138

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type: Journal Article

metadata version: 2024-02-05

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Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic:
NBTI and irradiation related degradation mechanisms in power VDMOS transistors. Microelectron. Reliab. 88-90: 135-141 (2018)

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