"Do ESD fails in systems correlate with IC ESD robustness?"

Wolfgang Stadler et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.029

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type: Journal Article

metadata version: 2021-10-14

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Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner:
Do ESD fails in systems correlate with IC ESD robustness? Microelectron. Reliab. 49(9-11): 1079-1085 (2009)

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