"Interfacial layer quality effects on low-frequency noise (1/f) in ..."

Paolo Srinivasan et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, Durga Misra, Cor Claeys:
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks. Microelectron. Reliab. 47(4-5): 501-504 (2007)

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