"High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a ..."

Giovanna Sozzi, Roberto Menozzi (2002)

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DOI: 10.1016/S0026-2714(01)00240-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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Giovanna Sozzi, Roberto Menozzi:
High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. Microelectron. Reliab. 42(1): 53-59 (2002)

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