"A study of advanced layout verification to prevent leakage current failure ..."

Yong-Ha Song et al. (2002)

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DOI: 10.1016/S0026-2714(02)00155-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yong-Ha Song, Myoung-Lae Park, Gye-Won Jung, Taek-Soo Kim:
A study of advanced layout verification to prevent leakage current failure during power down mode operation. Microelectron. Reliab. 42(9-11): 1385-1388 (2002)

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