"New concepts of worst-case delay and yield estimation in asynchronous VLSI ..."

Miljana Sokolovic, Vanco B. Litovski, Mark Zwolinski (2009)

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DOI: 10.1016/J.MICROREL.2008.11.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Miljana Sokolovic, Vanco B. Litovski, Mark Zwolinski:
New concepts of worst-case delay and yield estimation in asynchronous VLSI circuits. Microelectron. Reliab. 49(2): 186-198 (2009)

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