"Lifetime tests of 600-V GaN-on-Si power switches and HEMTs."

K. V. Smith et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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K. V. Smith, J. Haller, Josep M. Guerrero, R. P. Smith, R. Lal, YiFeng Wu:
Lifetime tests of 600-V GaN-on-Si power switches and HEMTs. Microelectron. Reliab. 58: 197-203 (2016)

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