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"Analysis of neutron-induced single-event burnout in SiC power MOSFETs."
Tomoyuki Shoji et al. (2015)
- Tomoyuki Shoji, Shuichi Nishida, Kimimori Hamada, Hiroshi Tadano:
Analysis of neutron-induced single-event burnout in SiC power MOSFETs. Microelectron. Reliab. 55(9-10): 1517-1521 (2015)
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