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"Structure variation effects on device reliability of single photon ..."
Dongseok Shin et al. (2017)
- Dongseok Shin, Byungchoul Park, Youngcheol Chae, Ilgu Yun:
Structure variation effects on device reliability of single photon avalanche diodes. Microelectron. Reliab. 76-77: 610-613 (2017)
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