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"Numerical study of microbump failure in 3D microelectronic structures."

Yu-Lin Shen, Geno C. Flores, J. Guthrie (2016)

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DOI: 10.1016/J.MICROREL.2016.01.004

access: closed

type: Journal Article

metadata version: 2022-06-17

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Yu-Lin Shen, Geno C. Flores, J. Guthrie:
Numerical study of microbump failure in 3D microelectronic structures. Microelectron. Reliab. 61: 48-55 (2016)

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