"Substrate potential shift due to parasitic minority carrier injection in ..."

Michael Schenkel et al. (2001)

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DOI: 10.1016/S0026-2714(01)00028-2

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type: Journal Article

metadata version: 2020-02-22

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Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner:
Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. Microelectron. Reliab. 41(6): 815-822 (2001)

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