"Mission profile resolution impacts on the thermal stress and reliability ..."

Ariya Sangwongwanich et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.094

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SangwongwanichZ18
Ariya Sangwongwanich, Dao Zhou, Elizaveta Liivik, Frede Blaabjerg:
Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters. Microelectron. Reliab. 88-90: 1003-1007 (2018)

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