"Modeling and analysis of crosstalk induced overshoot/undershoot effects in ..."

Manodipan Sahoo, Hafizur Rahaman (2016)

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DOI: 10.1016/J.MICROREL.2016.06.017

access: closed

type: Journal Article

metadata version: 2020-10-26

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Manodipan Sahoo, Hafizur Rahaman:
Modeling and analysis of crosstalk induced overshoot/undershoot effects in multilayer graphene nanoribbon interconnects and its impact on gate oxide reliability. Microelectron. Reliab. 63: 231-238 (2016)

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