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"Lifetime of power electronics interconnections in accelerated test ..."
Wissam Sabbah et al. (2017)
- Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel:
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. Microelectron. Reliab. 76-77: 444-449 (2017)
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