"Identification of the degradation state for condition-based maintenance of ..."

Marco Rigamonti et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.02.015

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type: Journal Article

metadata version: 2022-10-02

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Marco Rigamonti, Piero Baraldi, Enrico Zio, Allegra Alessi, Daniel Astigarraga, Ainhoa Galarza:
Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach. Microelectron. Reliab. 60: 48-61 (2016)

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