"New experimental approach for failure prediction in electronics: ..."

Isaline Richard, Romain Fayolle, Jean-Claude Lecomte (2005)

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DOI: 10.1016/J.MICROREL.2005.07.071

access: closed

type: Journal Article

metadata version: 2020-02-22

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Isaline Richard, Romain Fayolle, Jean-Claude Lecomte:
New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectron. Reliab. 45(9-11): 1645-1651 (2005)

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