"Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer ..."

R. Ricciari et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.07.020

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type: Journal Article

metadata version: 2024-10-06

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R. Ricciari, E. P. Ferlito, G. Pizzo, M. Padalino, G. Anastasi, M. Sacchi, G. Pappalardo, C. Consalvo, Domenico Mello:
Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. Microelectron. Reliab. 55(9-10): 1617-1621 (2015)

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