"High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology."

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00204-9

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/Rey-TauriacTB01a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/Rey-TauriacTB01a
Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud:
High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 41(9-10): 1707-1712 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.