"Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology."

Yannick Rey-Tauriac et al. (2003)

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DOI: 10.1016/S0026-2714(03)00317-2

access: closed

type: Journal Article

metadata version: 2023-08-28

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Yannick Rey-Tauriac, Olivier de Sagazan, M. Taurin, Olivier Bonnaud:
Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 43(9-11): 1865-1869 (2003)

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