"Fast and rigorous use of thermal time constant to characterize back end of ..."

Antoine Reverdy et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.045

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type: Journal Article

metadata version: 2020-02-22

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Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier:
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. Microelectron. Reliab. 48(8-9): 1279-1284 (2008)

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