"Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks."

Gilles Reimbold et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.068

access: closed

type: Journal Article

metadata version: 2023-05-09

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Gilles Reimbold, Jérôme Mitard, Xavier Garros, Charles Leroux, Gérard Ghibaudo, François Martin:
Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks. Microelectron. Reliab. 47(4-5): 489-496 (2007)

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