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"Capacitive effects in IGBTs limiting their reliability under short circuit."
Paula Diaz Reigosa et al. (2017)
- Paula Diaz Reigosa, Francesco Iannuzzo, Munaf Rahimo, Frede Blaabjerg:
Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectron. Reliab. 76-77: 485-489 (2017)
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