"Fast reliability qualification of SiP products."

Charles Regard et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.042

access: closed

type: Journal Article

metadata version: 2020-02-22

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Charles Regard, Christian Gautier, Hélène Frémont, Patrick Poirier, Xiaosong Ma, Kaspar M. B. Jansen:
Fast reliability qualification of SiP products. Microelectron. Reliab. 49(9-11): 958-962 (2009)

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