"Harsh environment application of electronics - Reliability of copper ..."

Sabrina Rathgeber et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.083

access: closed

type: Journal Article

metadata version: 2021-03-30

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Sabrina Rathgeber, R. Bauer, Andreas Otto, Erik Peter, Jürgen Wilde:
Harsh environment application of electronics - Reliability of copper wiring and testability thereof. Microelectron. Reliab. 52(9-10): 2452-2456 (2012)

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