"Estimating the Single-Event Upset sensitivity of a memory array using ..."

Mélanie Raine et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.09.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mélanie Raine, Marc Gaillardin, Thierry Lagutere, Olivier Duhamel, Philippe Paillet:
Estimating the Single-Event Upset sensitivity of a memory array using simulation. Microelectron. Reliab. 78: 349-354 (2017)

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