"Application of the defect clustering model for forming, SET and RESET ..."

Nagarajan Raghavan (2016)

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DOI: 10.1016/J.MICROREL.2016.07.139

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nagarajan Raghavan:
Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. Microelectron. Reliab. 64: 54-58 (2016)

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